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Thursday, April 4 • 9:00am - 9:25am
BKK19-416 Automating test results analysis using neural networks

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Test results triage is the most time-consuming step currently in Texas Instruments CI cycle. Embedded tests are more susceptible to failures caused by external factors due to test setup complexity. A typical embedded test contains multiple points of failure.
This work uses a neural network to classify test results automatically and to detect 'real' regressions. It helps scaling TI's validation cycle by automating the most time-consuming step.

Speakers
avatar for Carlos Hernandez

Carlos Hernandez

Integration & Validation mgr, Texas Instruments
15+ years of experience in the embedded industry.Co-author of Opentest validation framewrok.Linux Integration & Validation manager at TI since 2015.



Thursday April 4, 2019 9:00am - 9:25am
Session Room 3 (Lotus 10)

Attendees (55)




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